Part Number Hot Search : 
0603C10 XC5VLX85 330M2 1SRWA CS844 PQ60018 2903Z 10050
Product Description
Full Text Search
 

To Download TLP263007 Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 TLP2630
TOSHIBA Photocoupler GaAAs Ired & Photo IC
TLP2630
Digital Logic Isolation Tele-Communication Analog Data Equipment Control Microprocessor System Interface
The TOSHIBA TLP2630 dual photocoupler consists of a pair of GaAAs light emitting diode and integrated high gain, high speed photodetector. The output of the detector circuit is an open collector, schottky clamped transistor.This unit is 8-lead DIP. * * * * * * Input current threshold: IF = 5mA(max.) LSTTL/TTL compatible: 5V supply Switching speed: 10MBd(typ.) Guaranteed performance over temperature: 0~70C Isolation voltage: 2500Vrms(min.) UL recognized:UL1577, file no. E67349 TOSHIBA Weight: 0.54 g 11-10C4 Unit in mm
Pin Configuration (top view)
1 2 3 4 GND VCC 8 7 6 5 1: Anode 1 2: Cathode 1 3: Cathode 2 4: Anode 2 5: GND 6: VO2 (output 2) 7: VO1 (output 1) 8: VCC
Truth Table (positive logic)
Input H L Output L H
Schematic
+ VF1 + VF2 1 2 4 3 5 GND IF2 IO2 6 IF1 ICC IO1 8 7 VCC VO1
A 0.01 to 0.1F bypass capacitor must connected between pins 8 and 5 (see Note 1).
VO2
1
2007-10-01
TLP2630
Absolute Maximum Ratings (no derating required up to 70C)
Characteristic Forward current(each channel) LED Pulse forward current (each channel)* Reverse voltage(each channel) Output current(each channel) Detector Output voltage(each channel) Supply voltage (1 minute maximum) Output collector power dissipation(each channel) Operating temperature range Storage temperature range Lead soldering temperature (10 s) (Note 1) Isolation voltage (AC, 1 min., R.H. 60%, Note 3) Symbol IF IFP VR IO VO VCC PO Tstg Topr Tsol BVS Rating 20 30 5 16 -0.5~7 7 40 -55~125 -40~85 260 2500 Unit mA mA V mA V V mW C C C Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). * t 1 msec duration.
Recommended Operating Conditions
Characteristic Input current, low level, each channel Input current, high level, each channel Supply voltage**, output Fan out(TTL load, each channel) Operating temperature Symbol IFL IFH VCC N Topr Min. 0 6.3* 4.5 0 Typ. 5 Max. 250 15 5.5 8 70 C Unit A mA V
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. * 6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 5.0mA or less. **This item denotes operating ranges, not meaning of recommended operating conditions.
2
2007-10-01
TLP2630
Electrical Characteristics (Ta = 0~70C, unless otherwise noted)
Characteristic Input forward voltage (each channel) Input diode temperature coefficient(each channel) Input reverse breakdown voltage(each channel) Input capacitance (each channel) High level output current (each channel) Low level output voltage (each channel) High level supply current (both channels) Low level supply current (both channels) Isolation voltage Capacitance(input-output) Input-input leakage current Resistance(input-input) Capacitance(input-input) Symbol VF VF / Ta BVR CT IOH VOL ICCH ICCL RS CS II-I RI-I CI-I Test Condition IF = 10mA, Ta = 25C IF = 10mA IR = 10A, Ta = 25C VF = 0, f = 1MHz VCC = 5.5V, VO = 5.5V IF = 250A VCC = 5.5V, IF = 5mA IOL(sinking) = 13mA VCC = 5.5V, IF = 0 VCC = 5.5V, IF = 10mA VS = 500V, R.H. 60% f = 1MHz R.H. 60%, t = 5s VI-I = 500V VI-I = 500V f = 1MHz (Note 3) (Note 3) (Note 6) (Note 6) (Note 6) Min. 5 Typ.* 1.65 -2.0 45 1 0.4 14 24 10
14
Max. 1.75 250 0.6 30 36
Unit V mV / C V pF A V mA mA pF A pF
0.6 0.005 10
11
0.25
*
All typical values are at VCC = 5V, Ta = 25C.
3
2007-10-01
TLP2630
Switching Characteristics (Ta =25C , VCC=5V)
Characteristic Propagation delay time to low output level Propagation delay time to high output level Output rise a time,output fall time(10~90%) Common mode transient immunity at high output level Common mode transient immunity at low output level Symbol Test Cir- cuit 1 1 1 Test Condition IF = 07.5mA, RL = 350 CL = 15pF (each channel) IF = 7.5mA0, RL = 350 CL = 15pF (each channel) IF = 0 7.5mA, RL = 350 CL = 15pF (each channel) IF = 0, RL = 350 VCM = 200V VO(min.) = 2V (each channel, Note 4) IF = 7.5mA, RL = 350 VCM = 200V VO(max.) = 0.8V (each channel, Note 5) Min. Typ. Max. Unit
tpHL tpLH tr,tf
60 60 30
75 75
ns ns ns
CMH
2
200
V / s
CML
2
-500
V / s
(Note 1) 2mm below seating plane. (Note 2) The VCC supply voltage to each TLP2630 isolator must be bypassed by a 0.01F capacitor or larger.This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. (Note 3) Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. (Note 4) CMHthe maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state(i.e., VOUT > 2.0V) (Note 5) CMLthe maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state(i.e., VOUT > 0.8V) Measured in volts per microsecond(V / s). (Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together.
4
2007-10-01
TLP2630
Test Circuit 1. tpHL And tpLH
Pulse input PW =10s Duty cycle=1/10
100
5V 1 2 3 4 VCC 8
0.1F
IF RL 350 CL VO 1.5V tpHL tpLH tr tf
7.5mA 3.75mA 0mA 5V
IF Monitor
7 6 GND 5
4.5V
1.5V 0.5V VOL
*
CL is approximately 15pF which includes probe and stray wirng capacitance.
Test Circuit 2. Transient Immunity And Typical Waveforms.
IF 1 2 A B VFF 3 4 200V
VCC
8
0.1F
5V RL 350
VCM
90% 10% tr tf
7 6 GND 5 VCM + -
0V
CL
VO Monitor VO (IF = 0mA) 5V 2V 0.8V VO (IF = 7.5mA) VOL
Pulse generator ZO=50 160(V) 160(V) CMH = , CML = t r (s) t f (s)
*
CL is approximately 15pF which includes probe and stray wirng capacitance.
5
2007-10-01
TLP2630
IF - VF
100 Ta = 25 C -2.6
VF / Ta - IF
10
Forward voltage temperature Coefficient VF / Ta (mV / C)
2.0
IF (mA)
-2.4
-2.2
Forward current
1
-2.0
-1.8
0.1
-1.6
0.01 1.0
1.2
1.4
1.6
1.8
-1.4 0.1
0.3 0.5
1
3
5
10
30
50
Forward voltage
VF (V)
Forward current
IF (mA)
VO - IF
8 VCC = 5 V
IOH - Ta
100 IF = 250 A VCC = 5.5 V VO = 5.5 V Ta = 25 C
IOH (A) High level output current
6
50 30
(V)
6
VO
4
RL= 350 1k 4k
Output voltage
10
2
5 3
0 0
1
2
3
4
5
Forward current
IF (mA)
1 0 10 20 30 40 50 60 70
Ambient temperature Ta (C)
10
VO - IF
VCC = 5 V
VOL - Ta
IF = 5 mA
VOL (V)
RL= 350 8 RL= 4k
0.5
VCC = 5.5 V
(V)
IOL=16mA
Low level output voltage
VO
6
0.4 12.8mA 9.6mA 6.4mA 0.3
Output voltage
Ta= 70C 4 0C
2
0.2 0 0 0 1 2 3 4 5 6
20
40
60
80
Ambient temperature Ta (C)
Forward current
IF (mA)
6
2007-10-01
TLP2630
tpHL, tpLH - IF
120 tpLH 100 RL=4k 100 120
tpHL, tpLH - Ta
RL=4k tpLH 350k 1k 80 tpLH 350 60 tpHL 40 VCC = 5 V IF = 7.5 mA 1k 4k
Propagation delay time tpHL, tpLH (ns)
80
tpLH tpHL
1k 350 350 1k 4k Ta = 25 C VCC = 5 V
60
40
20
Propagation delay time tpHL, tpLH (ns)
20 19
0 5
7
9
11
13
15
17
0 0
Forward current
IF (mA)
10
20
30
40
50
60
70
Ambient temperature Ta (C)
tr, tf - Ta
320 VCC = 5 V IF = 7.5 mA 300 RL=4k
(ns)
tf 280 80 tf
Rise, fall time tr, tf
1k
60 tf 350
40
20
tr
350 1k 4k
0 0
10
20
30
40
50
60
70
Ambient temperature Ta (C)
7
2007-10-01
TLP2630
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
8
2007-10-01


▲Up To Search▲   

 
Price & Availability of TLP263007

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X